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Our Level AFM offers a wide Spectrum of Measurement Methods:

• High Resolution Dynamic & Contact Mode
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• Current-AFM Mode
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• Lateral Force Mode
• Force Spectroscopy
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• Kelvin Probe Force Microscopy
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• Magnetic Force Microscopy
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• Electrical Force Microscopy
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• Nano-Lithography with script-language
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• Elastic Force Microscopy (Force Modulation Mode)
  SYSTEM PARAMETERS:
  lateral resolution: < 1 nm (practical resolution)
  technical resolution: 0.19 nm (18 bit achieved technical resolution)
  mathematical resolution: 32 Bit (< 0.1 pm)
  height resolution: < 150 pm noise floor in DNC (atomic steps and layers)
  technical resolution: 0.026 nm (18 bit achieved technical resolution)
  maximum scan range: 50 mm (standard, others possible on request), z-range: 6 μm
  maximum sample size: 4 cm x 6 cm
  manual positioning range: 5 mm x 5 mm
  accessories: 15 cantilevers; 1 calibration grating UMG01
  20 sample holders; 2 sample boxes, tweezers

OPTIONAL FEATURES (NOT NECESSARY FOR STANDARD APPLICATIONS):
1.Vibration isolation table under the microscope
2.Hardware scanner linearisation
3.Glass bell jar for acoustic protection
4.Additional cantilever packages and gratings
5.enhanced LFM mode sensitivity due to a spot-like laser diode
6.additional LockIn amplifier for dynamic EFM or MFM
7.implemented Kelvin feedback
8.current amplifier for conductance AFM incl. power supply
SPIP – Scanning Probe Image Processor - with all costumer specific modules from Imaging
Metrology
9. 2nd TFT monitor

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